A new on-wafer large-signal waveform measurement system with 40 GHz harmonic bandwidth
- 2 January 2003
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- No. 0149645X,p. 1435-1438
- https://doi.org/10.1109/mwsym.1992.188279
Abstract
A novel on-wafer large-signal waveform measurement system with a 40-GHz harmonic frequency range using a microwave transition analyzer is presented. Potential applications are illustrated by the measurement of the harmonic amplitude and phase spectra of the reflection and transmission response of a 0.3- mu m InGaAs pseudomorphic HEMT (high-electron-mobility transistor) under X-band sinusoidal stimulus.Keywords
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