Variable Index of Refraction Ultrathin Films Formed from Self-Assembled Zirconium Phosphonate Multilayers: Characterization by Surface Plasmon Resonance Measurements and Polarization/Modulation FT-IR Spectroscopy
- 1 October 1995
- journal article
- Published by American Chemical Society (ACS) in Analytical Chemistry
- Vol. 67 (20), 3767-3774
- https://doi.org/10.1021/ac00116a024