Angle-resolved electron spectrometer with multidetection

Abstract
A high‐resolution, angle‐resolved photoemissionelectron spectrometer has been built which incorporates a position‐sensitive multidetection system. The spectrometer is a 180 ° hemispherical electrostatic deflection analyzer utilizing preretardation, 1.5 ° angle‐resolving optics mounted on a two‐axis angular manipulator. Combined with the sample holder, independent control of the polar and azimuthal angles of both the sample and detector are available. The multidetection spectrometer collects through a PDP‐11 based data acquisition and control system up to 32 resolution elements per spectral frame.