Eliminating threshold losses in MOS circuits by bootstrapping using varactor coupling
- 1 June 1972
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Journal of Solid-State Circuits
- Vol. 7 (3), 217-224
- https://doi.org/10.1109/jssc.1972.1050280
Abstract
No abstract availableKeywords
This publication has 1 reference indexed in Scilit:
- SURFACE CHARGE TRANSPORT IN SILICONApplied Physics Letters, 1970