Normal emissivity of samples surrounded by surfaces at diverse temperatures
- 1 September 2005
- journal article
- Published by Elsevier in Measurement
- Vol. 38 (2), 124-131
- https://doi.org/10.1016/j.measurement.2005.05.001
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
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- Model-based emissivity correction in pyrometer temperature control of rapid thermal processing systemsIEEE Transactions on Semiconductor Manufacturing, 1993
- Thermal imaging of electronic devices with low surface emissivityIEE Proceedings G Circuits, Devices and Systems, 1991
- The International Temperature Scale of 1990 (ITS-90)Metrologia, 1990