CuS thin films on flexible substrates

Abstract
A report is presented on the electrical and structural properties of Cu7S4 films deposited on polyimide substrate at temperatures close to room temperature using the water solutions of complex-salt compounds. The X-ray diffraction data identified Cu7S4 crystalline monoclinic structure. The resistance of the film increased by 350% under tensile strain and by 5% under compressive strain. Maximal value of the gauge factor was found to be G≃103.

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