Reflection electron microscopy of clean and gold deposited (111) silicon surfaces
- 2 July 1980
- journal article
- Published by Elsevier in Surface Science
- Vol. 97 (2-3), 393-408
- https://doi.org/10.1016/0039-6028(80)90675-5
Abstract
No abstract availableKeywords
This publication has 15 references indexed in Scilit:
- Surface study by an UHV electron microscopeSurface Science, 1979
- Some New Techniques in Reflection High Energy Electron Diffraction (RHEED) Application to Surface Structure StudiesJapanese Journal of Applied Physics, 1977
- Epitaxy of noble metals and (111) surface superstructures of silicon and germanium part I: Study at room temperatureThin Solid Films, 1976
- Surface imaging using diffracted electronsSurface Science, 1976
- Discrimination of double positioning by the nucleation of crystallites on molybdeniteJournal of Crystal Growth, 1974
- Direct resolution of surface atomic steps by transmission electron microscopyPhilosophical Magazine, 1974
- The growth and structure of semiconducting thin filmsReports on Progress in Physics, 1974
- Si(111) surface structures by glancing-incidence high-energy electron diffractionActa Crystallographica Section A, 1972
- Oberflächenstrukturen und Kristallbaufehler im elektronenmikroskopischen Bild, untersucht am NaCl (I)Physica Status Solidi (b), 1962
- Oberflächenstrukturen und Kristallbaufehler im elektronenmikroskopischen Bild, untersucht am NaCl (II)Physica Status Solidi (b), 1962