Quantitative analysis by X-ray photoelectron spectroscopy without reference samples
- 31 December 1982
- journal article
- Published by Elsevier in Spectrochimica Acta Part B: Atomic Spectroscopy
- Vol. 37 (6), 461-471
- https://doi.org/10.1016/0584-8547(82)80020-7
Abstract
No abstract availableKeywords
This publication has 34 references indexed in Scilit:
- Is there a universal mean-free-path curve for electron inelastic scattering in solids?Journal of Electron Spectroscopy and Related Phenomena, 1981
- ESCA study of Cu/SiO2 and Fe/SiO2 interfaces heated in high vacuumSurface and Interface Analysis, 1981
- ESCA study of Cu/Ni and Cu/Ag alloys filed in air and heated in high vacuumSurface and Interface Analysis, 1981
- Circumventing the matrix dependent inelastic mean free path in XPSSurface and Interface Analysis, 1980
- The quantitative analysis of surfaces by XPS: A reviewSurface and Interface Analysis, 1980
- Relative intensities in x-ray photoelectron spectra: Part IV. The effect of elastic scattering in a solid on the free path of electrons and their angular distributionJournal of Electron Spectroscopy and Related Phenomena, 1979
- Quantitative electron spectroscopy of surfaces: A standard data base for electron inelastic mean free paths in solidsSurface and Interface Analysis, 1979
- Theoretical Calculation of Fluorescent X-Ray Intensities of Nickel-Iron-Chromium Ternary AlloysBulletin of the Chemical Society of Japan, 1967
- Simplification of a formula in the correlation of fluorescent X-ray intensities from mixturesSpectrochimica Acta, 1959
- The theoretical derivation of fluorescent X-ray intensities from mixturesSpectrochimica Acta, 1955