A high temperature attachment for an X-ray diffractometer for precision lattice parameter measurements
- 1 April 1965
- journal article
- Published by IOP Publishing in Journal of Scientific Instruments
- Vol. 42 (4), 212-218
- https://doi.org/10.1088/0950-7671/42/4/307
Abstract
A description is given of the design, construction and use of an attachment for an X-ray diffractometer which enables lattice parameters to be determined to 1 part in 20 000 at temperatures between room temperature and 1000°C. Special attention is given to the problems of temperature measurement and uniformity. The instrument also incorporates a device for specimen alignment. The results of a study of the thermal expansion of pure aluminium are given and are found to be in excellent agreement with the recent single crystal results of Simmons and Balluffi.Keywords
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