Ultrahigh Reliability Prediction for Fault-Tolerant Computer Systems
- 1 December 1983
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Computers
- Vol. C-32 (12), 1118-1127
- https://doi.org/10.1109/tc.1983.1676172
Abstract
A review and a critical evaluation of a representative class of state-of-the-art models for ultrahigh reliability prediction is presented. This evaluation naturally leads us to a new model for ultrahigh reliability prediction now under development. The new model combines the flexibility and accuracy of simulation with the speed of analytic models.Keywords
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