Local bonding and electronic structure obtained from electron energy loss scattering
- 1 January 1987
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 22 (1-4), 89-101
- https://doi.org/10.1016/0304-3991(87)90053-2
Abstract
No abstract availableThis publication has 32 references indexed in Scilit:
- The structural sensitivity of electron energy-loss near-edge structure (ELNES)Ultramicroscopy, 1985
- An illustrated review of various factors governing the high spatial resolution capabilities in EELS microanalysisUltramicroscopy, 1985
- -Edge Absorption Spectra of the Rare Earths: Assessment of the Single-Particle PicturePhysical Review Letters, 1983
- Electron energy loss near edge structure (ELNES), a potential technique in the studies of local atomic arrangementsUltramicroscopy, 1982
- Design considerations and performance of an analytical stemUltramicroscopy, 1981
- Quantitative microanalysis by electron energy-loss spectroscopy: Two correctionsUltramicroscopy, 1980
- Uniqueness and the inversion problem of incoherent multiple scatteringUltramicroscopy, 1979
- Formulae for light-element micro analysis by electron energy-loss spectrometryUltramicroscopy, 1978
- The microanalysis of light elements using transmitted energy loss electronsUltramicroscopy, 1975
- Inelastic scattering of 80 keV electrons in amorphous carbonPhilosophical Magazine, 1975