[sup 18]O Tracer Study of Porous Film Growth on Aluminum in Phosphoric Acid
- 1 January 2010
- journal article
- Published by The Electrochemical Society in Journal of the Electrochemical Society
- Vol. 157 (11), C399
- https://doi.org/10.1149/1.3490640
Abstract
International audience(18)O tracer is used to investigate the development of porous anodic films at constant current in phosphoric acid on electropolished aluminum. A barrier layer and porous region form initially with the pore size related to the surface texture of the substrate. Subsequently, major pores emerge, with their sizes related to the anodizing voltage. The evolution of the film is accompanied by increases in growth rate and formation efficiency. The (18)O ions of a preformed oxide are retained in the film during anodization in a nonenriched electrolyte, with (18)O being partitioned among (i) the surface region of texture-dependent porosity, (ii) the walls of major pores, and, in diminishing amounts, (iii) the inner region of the barrier layer. (c) 2010 The Electrochemical Society. [DOI: 10.1149/1.3490640] All rights reservedKeywords
This publication has 58 references indexed in Scilit:
- Impurity-driven defect generation in porous anodic aluminaElectrochemistry Communications, 2010
- Chemical composition and structural changes of porous templates obtained by anodising aluminium in phosphoric acid electrolyteSurface and Interface Analysis, 2010
- Influence of crystal orientation and surface topography of aluminum substrate on pore nucleation of anodic porous aluminaJournal of Japan Institute of Light Metals, 2008
- A tracer investigation of chromic acid anodizing of aluminiumSurface and Interface Analysis, 2007
- A Tracer Study of Porous Anodic AluminaElectrochemical and Solid-State Letters, 2006
- Ordered Metal Nanohole Arrays Made by a Two-Step Replication of Honeycomb Structures of Anodic AluminaScience, 1995
- Effect of pH on the Distribution of Anions in Anodic Oxide Films Formed on Aluminum in Phosphate SolutionsJournal of the Electrochemical Society, 1988
- Preparation of self-supporting anodic barrier films on aluminium for backscattering analysisSurface and Interface Analysis, 1982
- Hydrogen Profiles of Anodic Aluminum Oxide FilmsJournal of the Electrochemical Society, 1980
- Measurement of 18O concentration profiles using resonant nuclear reactionsJournal of Physics D: Applied Physics, 1972