The melting point of thin aluminium films
- 1 February 1964
- journal article
- Published by IOP Publishing in British Journal of Applied Physics
- Vol. 15 (2), 185-187
- https://doi.org/10.1088/0508-3443/15/2/310
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Measurement of the Thickness of Vacuum Deposits Using the Electron MicroscopeNature, 1962
- An electro-polishing technique for the preparation of metal specimens for transmission electron microscopyPhilosophical Magazine, 1958
- The Thickness Measurement of Thin Films by Multiple Beam InterferometryJournal of Applied Physics, 1950