Detection of infrared photons using the electronic stress in metal–semiconductor cantilever interfaces
- 28 January 2000
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 82 (1-4), 49-56
- https://doi.org/10.1016/s0304-3991(99)00140-0
Abstract
No abstract availableKeywords
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