Precision Determination of the Lattice Constant by the Kossel Line Technique

Abstract

A high accuracy lattice constant determination of a specimen is possible through the analysis of the x‐ray diffraction image known as Kossel lines. In the present work general formulas are derived by which the lattice constant can be obtained from the Kossel line picture. The lattice constant of a nickel specimen is then measured to demonstrate the applicability of the method.