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Electronic transport properties of tantalum disilicide thin films
Home
Publications
Electronic transport properties of tantalum disilicide thin films
Electronic transport properties of tantalum disilicide thin films
MH
M. T. Huang
M. T. Huang
TM
T. L. Martin
T. L. Martin
VM
V. Malhotra
V. Malhotra
JM
J. E. Mahan
J. E. Mahan
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1 May 1985
journal article
Published by
American Vacuum Society
in
Journal of Vacuum Science & Technology B
Vol. 3
(3)
,
836-845
https://doi.org/10.1116/1.583113
Abstract
No abstract available
Keywords
DETECTION LIMIT
X RAY DIFFRACTION
HALL EFFECT
ROOM TEMPERATURE
ION BEAM
THIN FILM
ELECTRON TRANSPORT
TRANSITION METAL
Cited by 30 articles