Precipitates in YBa2Cu3O7−δ thin films annealed at low oxygen partial pressure
- 14 June 1993
- journal article
- research article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 62 (24), 3201-3203
- https://doi.org/10.1063/1.109624
Abstract
We have studied the precipitates in YBa2Cu3O7−δ(YBCO) thin films grown by the BaF2 process in pO2=4 Torr and 700 °C. While stoichiometric films result in BaCuO2 surface precipitates, we have found Y2Cu2O5 precipitates embedded in the matrix of the same film. Off stoichiometric films with Ba/Y2Cu2O5 in the film matrix. The estimated densities of the two precipitates favor a stoichiometric YBCO film matrix. This behavior is not explainable in terms of phase equilibria and is attributed to kinetic effects. The electrical properties of the films degrade as the Ba/Y ratio deviates from 2.00.Keywords
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