Growth and the microstructural and ferroelectric characterization of oriented BaMgF/sub 4/ thin films
- 1 November 1991
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control
- Vol. 38 (6), 663-671
- https://doi.org/10.1109/58.108867
Abstract
The growth of ferroelectric BaMgF/sub 4/ thin films on SiKeywords
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