The Temperature Variation of the Parameters of Silicon Controlled Rectifiers†
- 1 August 1964
- journal article
- electronics section
- Published by Taylor & Francis in Journal of Electronics and Control
- Vol. 17 (2), 145-157
- https://doi.org/10.1080/00207216408937694
Abstract
The parameters of silicon controlled rectifiers carrying two base contacts are measured as a function of temperature in the range from room temperature to the normal limits of operation (140-160°c). The values of current gain of the two basic transistor sections of the device are measured as functions of emitter current over the same range of temperatures. The switching condition is found to be independent of temperature and the experimental results are explained in terms of normal transistor theory.Keywords
This publication has 4 references indexed in Scilit:
- The Design of a Silicon Controlled Rectifier Carrying Two Base ContactsJournal of Electronics and Control, 1964
- Current Gain in p-n-p-n Silicon Controlled Rectifiers†Journal of Electronics and Control, 1963
- Multiterminal P-N-P-N SwitchesProceedings of the IRE, 1958
- Carrier Generation and Recombination in P-N Junctions and P-N Junction CharacteristicsProceedings of the IRE, 1957