Abstract
An x‐ray area detector has been constructed that has the following capabilities: lower noise and/or higher spatial resolution than previous opto‐electronic designs; higher spatial resolution and no significant countrate limitations as compared to multiwire designs; and capability of acquiring millisecond‐ or microsecond‐wide snapshots of a kinetically evolving x‐ray pattern. An important feature of the present detector is that all key components are commercially produced; this detector can readily be duplicated in other laboratories.

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