Correction for Defocusing in the Schulz Technique for Pole Figure Determination
- 1 June 1972
- journal article
- research article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 43 (6), 2907
- https://doi.org/10.1063/1.1661621
Abstract
The intensity of the diffracted x‐ray beam captured by the receiving slits is calculated as a function of the angle the sample is tilted out of the position parallel to the diffractometer axis around the bisectrix of incident and diffracted x‐ray beams. Only the experimental determination of the line profile of the untilted sample and simple numerical computations are required.Keywords
This publication has 3 references indexed in Scilit:
- Defocusing for the Schulz Technique of Determining Preferred OrientationJournal of Applied Physics, 1970
- Determination of Relative Intensity in X-Ray Reflection StudyJournal of Applied Physics, 1965
- A Direct Method of Determining Preferred Orientation of a Flat Reflection Sample Using a Geiger Counter X-Ray SpectrometerJournal of Applied Physics, 1949