The case of AC stress in the hot-carrier effect

1 March 1986

journal article
Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Electron Devices

Vol. 33 (3), 424-426
https://doi.org/10.1109/T-ED.1986.22504

Abstract

During ac hot-carrier stress, the direction of the transient current flow is demonstrated to be important in device degradation as well as the amount of substrate current generated in transient periods.

Keywords

HOT CARRIERS
CIRCUITS
DEGRADATION
THRESHOLD VOLTAGE
STRESS
IMPACT IONIZATION

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