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The case of AC stress in the hot-carrier effect
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The case of AC stress in the hot-carrier effect
The case of AC stress in the hot-carrier effect
KC
Kueing-Long Chen
Kueing-Long Chen
SS
S. Saller
S. Saller
RS
R. Shah
R. Shah
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1 March 1986
journal article
Published by
Institute of Electrical and Electronics Engineers (IEEE)
in
IEEE Transactions on Electron Devices
Vol. 33
(3)
,
424-426
https://doi.org/10.1109/T-ED.1986.22504
Abstract
During ac hot-carrier stress, the direction of the transient current flow is demonstrated to be important in device degradation as well as the amount of substrate current generated in transient periods.
Keywords
HOT CARRIERS
CIRCUITS
DEGRADATION
THRESHOLD VOLTAGE
STRESS
IMPACT IONIZATION
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Open Access
Cited by 52 articles