Noninterferometric measurement of the x-ray refractive index of beryllium
- 15 July 1984
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 30 (2), 643-646
- https://doi.org/10.1103/physrevb.30.643
Abstract
The real decrement of the x-ray refractive index of beryllium was measured for the lines of Cu, Mo, and Ag to an accuracy ≲0.1% with the use of a thin-wafer monolithic Laue-Laue diffractometer of a novel design. The results are in excellent agreement with theory. A full discussion of the method is given and ways of increasing its accuracy indicated.
Keywords
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