Oscillator Strengths of the First Negative and Second Positive Systems of Nitrogen
- 1 April 1966
- journal article
- research article
- Published by AIP Publishing in The Journal of Chemical Physics
- Vol. 44 (7), 2672-2677
- https://doi.org/10.1063/1.1727109
Abstract
A fluorescence‐lifetime‐measuring technique which employs pulsed or modulated rf discharges is described. The method is applied to the emission of the second positive and first negative systems of nitrogen. Values of the lifetime of the upper states of both systems are given, and their variation with gas pressure and electron energy is discussed. Recommended values for the oscillator strengths are presented.Keywords
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