Analytical and chemical techniques in the study of surface species in atomic layer epitaxy
- 1 March 1993
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 225 (1-2), 280-283
- https://doi.org/10.1016/0040-6090(93)90170-t
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Determination of chromium and titanium in silica-based catalysts by ultraviolet/visible spectrophotometryThe Analyst, 1992
- Atomic layer growth of TiO2 on silicaApplied Surface Science, 1992
- Silicon-29 NMR study of dehydrated/rehydrated silica gel using cross polarization and magic-angle spinningJournal of the American Chemical Society, 1983