Behaviour of thin planar Sm C* samples in an electric field

Abstract

Three types of structures which can exist in planar Sm C* samples, depending on sample thickness, are described. Two critical thicknesses limiting the existence of the twisted nonhelical configuration are defined. Behaviour of this structure in an electric field is theoretically solved for simplified anchoring conditions. The critical field for the transition of the twisted structure to the homogeneous one is determined as a function of sample thickness, comparing the free energies of both structures