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MOS Electrical characteristics of low pressure re-oxidized nitrided-oxide
Home
Publications
MOS Electrical characteristics of low pressure re-oxidized nitrided-oxide
MOS Electrical characteristics of low pressure re-oxidized nitrided-oxide
RJ
R. Jayaraman
R. Jayaraman
WY
W. Yang
W. Yang
CS
C.G. Sodini
C.G. Sodini
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1 January 1986
proceedings article
Published by
Institute of Electrical and Electronics Engineers (IEEE)
https://doi.org/10.1109/iedm.1986.191280
Abstract
No abstract available
Keywords
MOBILITY MODEL
LOW PRESSURE
ANNEALING
Cited by 19 articles