A fast X-ray diffractometer based on a spherical drift multiwire proportional chamber
- 15 May 1980
- journal article
- Published by Elsevier in Nuclear Instruments and Methods
- Vol. 172 (1-2), 337-344
- https://doi.org/10.1016/0029-554x(80)90656-4
Abstract
No abstract availableKeywords
This publication has 7 references indexed in Scilit:
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- The electron stationary picture method for high-speed measurement of reflection intensities from crystals with large unit cellsActa Crystallographica Section A, 1978
- Some properties of spherical drift chambersNuclear Instruments and Methods, 1977
- The spherical drift chamber for x-ray imaging applicationsNuclear Instruments and Methods, 1974
- A multiwire proportional chamber as an area detector for protein crystallographyJournal of Applied Crystallography, 1974