X-ray photoelectron spectroscopy characterization of amorphous molybdenum oxysulfide thin films
- 1 March 1995
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 258 (1-2), 110-114
- https://doi.org/10.1016/0040-6090(94)06383-4
Abstract
No abstract availableThis publication has 13 references indexed in Scilit:
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