Interface positions measured at the lattice constant scale by Auger analysis on chemical bevels

Abstract
Experimental results of Auger profiles obtained on chemical bevels of hetero-epitaxial structures (InP/Gaxln1-xAs/lnP) are reported. The theoretical analysis of these results shows that the positions of the interfaces and widths of the quantum wells can be determined with an accuracy of ± one lattice spacing (ultimate limit). The evolution of the concentration gradient is also suggested. Quantum wells of ∼ 3.5 nm thick (6 lattice spacings) are well resolved