Wafer testing of thin film record and reproduce heads
- 1 November 1979
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Magnetics
- Vol. 15 (6), 1613-1615
- https://doi.org/10.1109/tmag.1979.1060482
Abstract
No abstract availableThis publication has 2 references indexed in Scilit:
- Combined thin film magnetoresistive read, inductive write headsIEEE Transactions on Magnetics, 1976
- Analysis of the Efficiency of Thin-Film Magnetic Recording HeadsJournal of Applied Physics, 1971