Potentialities of the gelius intensity model in quality control of valence XPS measurements
- 31 December 1984
- journal article
- Published by Elsevier in Journal of Electron Spectroscopy and Related Phenomena
- Vol. 33 (3), 263-268
- https://doi.org/10.1016/0368-2048(84)80022-5
Abstract
No abstract availableKeywords
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