A New Optical Interferometer for Absolute Measurement of Linear Displacement in the Subnanometer Range
- 1 April 1983
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 22 (4A), L233
- https://doi.org/10.1143/jjap.22.l233
Abstract
No abstract availableThis publication has 4 references indexed in Scilit:
- Monolithic Goniometer for Pure Rotation and Fine Orientation ControlJapanese Journal of Applied Physics, 1982
- Stabilized transverse Zeeman laser as a new light source for optical measurementApplied Optics, 1980
- A double-passed Michelson interferometerOptics Communications, 1972
- OPTICAL AND X-RAY INTERFEROMETRY OF A SILICON LATTICE SPACINGApplied Physics Letters, 1969