Étude de l'adsorption par ellipsométrie: adsorption du Xe/(0001) graphite
- 30 June 1975
- journal article
- Published by Elsevier in Surface Science
- Vol. 50 (2), 343-359
- https://doi.org/10.1016/0039-6028(75)90029-1
Abstract
No abstract availableThis publication has 11 references indexed in Scilit:
- Transition bidimensionnelle du premier ordre; cas du xénon adsorbé sur la face (0001) du graphiteSurface Science, 1974
- The adsorption of oxygen on silicon (111) surfaces. IISurface Science, 1974
- Étude par diffraction d'électrons lents de l'adsorption du xénon sur un monocristal du graphiteJournal of Crystal Growth, 1972
- Ellipsometric investigation of chemisorption on clean silicon (111) and (100) surfacesSurface Science, 1969
- Ellipsometry in the sub-monolayer regionSurface Science, 1969
- Anisotropy of the Optical Constants and the Band Structure of GraphitePhysical Review B, 1969
- A LEED investigation of physisorptionSurface Science, 1967
- Dependence on Temperature of the Interlayer Spacing in Carbons of Different Graphitic PerfectionNature, 1960
- X-Ray Measurement of Thermal Expansion Perpendicular to the Layer Planes of Artificial and Natural GraphitesNature, 1960
- The Solution of Argon in Layers of KryptonThe Journal of Physical Chemistry, 1954