Ballistic-electron emission microscopy study of the Au/Si(111)7×7 and Au/CaF2/Si(111)7×7 interfaces
- 25 April 1994
- journal article
- research article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 64 (17), 2300-2302
- https://doi.org/10.1063/1.111650
Abstract
Ballistic‐electron emission microscopy (BEEM) has been performed on Au/n‐Si(111)7×7 and Au/CaF2/n‐Si(111)7×7 in UHV. In both cases, the topography of the Au surface is characterized by ≊2.5 Å height terraces, stacked in several stages, with rounded shapes for Au/Si, and hexagonal shapes for Au/CaF2/Si. BEEM up to tip voltages of 8 V on Au/Si is not altering the ballistic transmissivity, in contrast to previous work on Au/Si interfaces which involved chemical preparations of the Si surfaces. The shape of the BEEM spectra on Au/CaF2/Si depends on spectral features of the density of states of the CaF2 thin film.Keywords
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