Influence of the doping level on the microstructure of P-type porous silicon studied by small-angle X-ray scattering

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1 October 1991

journal article
Published by International Union of Crystallography (IUCr) in Journal of Applied Crystallography

Vol. 24 (5), 581-587
https://doi.org/10.1107/s0021889891001085

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Cited by 15 articles