Variant in Technique for A. R. Lang's X-Ray Diffraction Topography
- 1 January 1961
- journal article
- research article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 32 (1), 125-126
- https://doi.org/10.1063/1.1735944
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
- Studies of Individual Dislocations in Crystals by X-Ray Diffraction MicroradiographyJournal of Applied Physics, 1959
- The projection topograph: a new method in X-ray diffraction microradiographyActa Crystallographica, 1959
- Direct Observation of Individual Dislocations by X-Ray DiffractionJournal of Applied Physics, 1958
- A Sensitive Method for Measuring Optical Scattering in SiliconJournal of the Electrochemical Society, 1958
- A method for the examination of crystal sections using penetrating characteristic X radiationActa Metallurgica, 1957
- Copper Precipitation on Dislocations in SiliconJournal of Applied Physics, 1956