A Condenser Aperture Device for Electron Microscopes
- 1 January 1951
- journal article
- research article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 22 (1), 104-105
- https://doi.org/10.1063/1.1699804
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- On the Investigation of Specimen Contamination in the Electron MicroscopeJournal of Applied Physics, 1948
- Dark-Field Electron Microscopy. I. Studies of Crystalline Substances in Dark-FieldJournal of Applied Physics, 1948
- An Effect of Electron Bombardment upon Carbon BlackJournal of Applied Physics, 1947
- A Discussion of the Illuminating System of the Electron MicroscopeJournal of Applied Physics, 1945