Microstructure of Y2O3 Fluxed Hot‐Pressed Silicon Nitride
- 1 March 1978
- journal article
- Published by Wiley in Journal of the American Ceramic Society
- Vol. 61 (3-4), 114-118
- https://doi.org/10.1111/j.1151-2916.1978.tb09251.x
Abstract
No abstract availableKeywords
This publication has 12 references indexed in Scilit:
- Grain Boundary Phases in a Hot‐Pressed MgO Fluxed Silicon NitrideJournal of the American Ceramic Society, 1977
- The formation of single-phase Si-Al-O-N ceramicsJournal of Materials Science, 1977
- Effect of selected impurities on the high temperature mechanical properties of hot-pressed silicon nitrideJournal of Materials Science, 1976
- 2 1/2D electron microscopy: Through-focus dark-field image shiftsJournal of Applied Physics, 1976
- Phase relationships in the system Si3N4-Y2O3-SiO2Journal of Materials Science, 1976
- Electron diffraction from areas less than 3 nm in diameterApplied Physics Letters, 1975
- The quantitative analysis of thin specimensJournal of Microscopy, 1975
- Reaction of Si3N4 and Y2O3 in Hot-PressingJournal of the American Ceramic Society, 1974
- The microstructures of silicon nitride ceramics during hot-pressing transformationsJournal of Materials Science, 1974
- Hot‐Pressed Si3N4Journal of the American Ceramic Society, 1973