In-plane deformation of cantilever plates with applications to lateral force microscopy
- 1 April 2004
- journal article
- research article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 75 (4), 878-883
- https://doi.org/10.1063/1.1667252
Abstract
The in-plane deformation of atomic force microscope(AFM) cantilevers under lateral loading is commonly assumed to have negligible effect in comparison to other deformation modes and ignored. In this article, we present a theoretical study of the behavior of cantilevers under lateral loading, and in so doing establish that in-plane deformation can strongly contribute to the total deformation, particularly for rectangular cantilevers of high aspect ratio (length/width). This has direct implications to lateral force microscopy, where the neglect of in-plane deformation can contribute to significant quantitative errors in force measurements and affect the interpretation of measurements. Consequently, criteria and approaches for minimizing the effects of in-plane deformation are presented, which will be of value to users and designers of AFM cantilevers. Accurate analytical formulas for the in-plane spring constants of both rectangular and V-shaped cantilevers are also presented.Keywords
This publication has 11 references indexed in Scilit:
- Susceptibility of atomic force microscope cantilevers to lateral forcesReview of Scientific Instruments, 2003
- Measuring normal and friction forces acting on individual fine particlesReview of Scientific Instruments, 2001
- Calibration of the torsional spring constant and the lateral photodiode response of frictional force microscopesReview of Scientific Instruments, 2000
- Force Calibration in Lateral Force MicroscopyJournal of Colloid and Interface Science, 2000
- A new calibration method of the lateral contact stiffness and lateral force using modulated lateral force microscopyTribology Letters, 1999
- Lateral stiffness: A new nanomechanical measurement for the determination of shear strengths with friction force microscopyApplied Physics Letters, 1997
- Calibration of frictional forces in atomic force microscopyReview of Scientific Instruments, 1996
- Parallel beam approximation for V-shaped atomic force microscope cantileversReview of Scientific Instruments, 1995
- Lateral, normal, and longitudinal spring constants of atomic force microscopy cantileversReview of Scientific Instruments, 1994
- Lateral Force Microscopy Study on the Shear Properties of Self-Assembled Monolayers of Dialkylammonium Surfactant on MicaLangmuir, 1994