Analytic solution of the Boltzmann equation with applications to electron transport in inhomogeneous semiconductors
- 15 April 1986
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 33 (8), 5575-5584
- https://doi.org/10.1103/physrevb.33.5575
Abstract
An analytic solution has been obtained to the one-dimensional Boltzmann transport equation in the relaxation-time approximation that is exact to first order in an arbitrary position- and time-dependent potential. This is the first practical method for studying time-dependent transport in inhomogeneous systems. The solution is correct for general relaxation times and arbitrarily large external electric fields, including the ballistic limit. This solution is used to study steady-state transport in two submicron structures: a doping superlattice, where the doping density is a sinusoidal function of position, and an GaAs junction. The distribution function for the device exhibits a ballistic peak by a new mechanism, in a regime where the potential has no local maximum to ‘‘skim’’ electrons. At zero temperature, the ballistic peak is a true singularity, rather than just a qualitative feature. Evidence is presented that an inhomogeneous potential causes a coherent excitation of plasmons. Analytic solutions have also been obtained, within these approximations, for initially nonequilibrium carrier distributions in the presence of potentials with arbitrary time and position dependence.
Keywords
This publication has 7 references indexed in Scilit:
- Hot-Electron Spectroscopy of GaAsPhysical Review Letters, 1985
- Ballistic electrons in an inhomogeneous submicron structure: Thermal and contact effectsPhysical Review B, 1984
- Injection dependence of quasiballistic transport in GaAs at 77 KSurface Science, 1983
- Ballistic and overshoot electron transport in bulk semiconductors and in submicronic devicesJournal of Applied Physics, 1983
- Monte Carlo particle simulation of GaAs submicron n+-i-n+ diodeElectronics Letters, 1982
- Measurement of J/V characteristics of a GaAs submicron n+-n−-n+ diodeElectronics Letters, 1982
- Near ballistic electron transport in GaAs devices at 77°KSolid-State Electronics, 1981