Study of Silicon-Silicon Dioxide Structure by Electron Spin Resonance I
- 1 January 1971
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 10 (1)
- https://doi.org/10.1143/jjap.10.52
Abstract
No abstract availableKeywords
This publication has 11 references indexed in Scilit:
- ESR Centers in Silicon MonoxideJapanese Journal of Applied Physics, 1970
- Electron paramagnetic resonance investigation of the Si-SiO2 interfaceSurface Science, 1969
- Si-SiO[sub 2] Fast Interface State MeasurementsJournal of the Electrochemical Society, 1968
- Characteristics of the Surface-State Charge (Qss) of Thermally Oxidized SiliconJournal of the Electrochemical Society, 1967
- Electron Spin Resonance in SiO2 Grown on SiliconJapanese Journal of Applied Physics, 1966
- Properties of Clean Silicon Surfaces by Paramagnetic ResonanceJournal of Applied Physics, 1966
- General Relationship for the Thermal Oxidation of SiliconJournal of Applied Physics, 1965
- Oxygen Adsorption on Silicon Surfaces Observed via Electron Spin ResonanceJournal of Applied Physics, 1964
- Paramagnetic Spectra ofCenters in Crystalline QuartzPhysical Review B, 1963
- Paramagnetic resonance studies of atomic hydrogen produced by ionizing radiationDiscussions of the Faraday Society, 1955