Scanning Wiener-fringe microscope with an optical fiber tip
- 1 August 1992
- journal article
- Published by Optica Publishing Group in Applied Optics
- Vol. 31 (22), 4515-4518
- https://doi.org/10.1364/ao.31.004515
Abstract
Optics InfoBase is the Optical Society's online library for flagship journals, partnered and copublished journals, and recent proceedings from OSA conferences.This publication has 10 references indexed in Scilit:
- Photon scanning tunneling microscopyReview of Scientific Instruments, 1990
- External and internal reflection near field microscopy: experiments and resultsApplied Optics, 1990
- Model for reflection near field optical microscopyApplied Optics, 1990
- Deposition and imaging of localized charge on insulator surfaces using a force microscopeApplied Physics Letters, 1988
- Atomic force microscopy using optical interferometryJournal of Vacuum Science & Technology A, 1988
- Magnetic imaging by ‘‘force microscopy’’ with 1000 Å resolutionApplied Physics Letters, 1987
- Atomic force microscope–force mapping and profiling on a sub 100-Å scaleJournal of Applied Physics, 1987
- Near-field optical-scanning microscopyJournal of Applied Physics, 1986
- Development of a 500 Å spatial resolution light microscopeUltramicroscopy, 1984
- Surface Studies by Scanning Tunneling MicroscopyPhysical Review Letters, 1982