The Infrared and Raman Spectra of SiF4

Abstract
The infrared and Raman spectra of SiF4 have been completely reexamined and extended. The Raman spectrum yields four lines at 268 cm−1, 390 cm−1, 800 cm−1, and 1010 cm−1, which have been assigned ν2, ν4, ν1, and ν3 respectively. In the infrared measurements, both prism and grating spectrometers were utilized. Several bands reported in earlier work have been ascribed to impurities and nine new bands have been observed and identified. The long‐wave ν4 at 391 cm−1 has been observed with a KRS−5 prism and its envelope determined. Bands involving ν3 appear to have a PR spacing of about 12 cm−1 while those involving ν4 appear to have a PR spacing of about 20 cm−1.

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