Red Electroluminescence and Crystallinity of ZnS:SmF3 Thin Films
- 1 June 1984
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 23 (6R)
- https://doi.org/10.1143/jjap.23.699
Abstract
The dependence of the red emission characteristics (emission efficiency, brightness and emission decay time) and crystallinity of ZnS:SmF3 thin-film electroluminescent (TFEL) devices upon fabrication parameters such as the SmF3 concentration and substrate temperature during evaporation, has been investigated. The electroluminescent characteristics are considered to be influenced more by the SmF3 concentration and the grain height in the film thickness direction, than by the cubic ZnS structure {111} plane orientation and the film uniformity, or by the degree to which the cubic {111} plane is oriented parallel to the substrate. A bright red electroluminescence of 1000 cd/m2 under 5 kHz sinusoidal voltage excitation and an emission efficiency of 0.078 lm/W are obtained in these ZnS:SmF3 TFEL devices.Keywords
This publication has 4 references indexed in Scilit:
- Green Electroluminescence in Low-Voltage-Driven Metal-Insulator-Semiconductor Structure DevicesJapanese Journal of Applied Physics, 1983
- The dependences of electroluminescent characteristics of ZnS:Mn thin films upon their device parametersJournal of Applied Physics, 1981
- X-ray diffraction study of thin electroluminescent ZnS films grown by atomic layer epitaxyPhysica Status Solidi (a), 1981
- Electroluminescent large - area image displayDisplays, 1980