Linearity Characterization of Connectorized Laser Diodes Under Microwave Intensity Modulation by AM/AM and AM/PM Measurements
- 23 March 2005
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- Vol. 86, 659-662
- https://doi.org/10.1109/mwsym.1986.1132274
Abstract
No abstract availableKeywords
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