Characterization of sapphire surfaces by electron energy-loss spectroscopy
- 1 July 1992
- journal article
- Published by Elsevier in Surface Science
- Vol. 273 (3), 427-436
- https://doi.org/10.1016/0039-6028(92)90079-l
Abstract
No abstract availableThis publication has 15 references indexed in Scilit:
- The surfaces of metal oxidesReports on Progress in Physics, 1985
- Valence- and conduction-band structure of the sapphire (11¯02) surfacePhysical Review B, 1985
- Ionicity of metallic oxide surfaces on metals as observed by Auger (XPS) spectroscopySurface and Interface Analysis, 1985
- Electronic structure of-alumina and its defect statesPhysical Review B, 1983
- Auger electron spectroscopy - a local probe for solid surfacesSurface Science Reports, 1981
- An X-ray photoelectron spectroscopy study of the chemical changes in oxide and hydroxide surfaces induced by Ar+ ion bombardmentThin Solid Films, 1978
- Electronic Structure of Aluminium Oxide as Determined by X‐Ray PhotoemissionPhysica Status Solidi (b), 1976
- Work function measurements by X-Pe spectroscopy, and their relevance to the calibration of X-Pe spectraChemical Physics Letters, 1973
- Silicon-on-Sapphire Epitaxy by Vacuum Sublimation: LEED–Auger Studies and Electronic Properties of the FilmsJournal of Vacuum Science and Technology, 1971
- Composition and surface structure of the (0001) face of .alpha.-alumina by low-energy electron diffractionThe Journal of Physical Chemistry, 1970