Effect of H2 Annealing on a Pt/PbZrxTi1-xO3 Interface Studied by X-Ray Photoelectron Spectroscopy
- 1 April 1997
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 36 (4A), L435-438
- https://doi.org/10.1143/jjap.36.l435
Abstract
No abstract availableKeywords
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