Photoemission measurement of surface states for annealed silicon
- 28 January 1974
- journal article
- Published by Elsevier in Physics Letters A
- Vol. 46 (6), 400-402
- https://doi.org/10.1016/0375-9601(74)90935-9
Abstract
No abstract availableThis publication has 5 references indexed in Scilit:
- Surface-State Transitions of Silicon in Electron Energy-Loss SpectraPhysical Review Letters, 1973
- Relationship between Atomic Structure and Electronic Properties of (111) Surfaces of SiliconPhysical Review Letters, 1972
- Observation of a Band of Silicon Surface States Containing One Electron Per Surface AtomPhysical Review Letters, 1972
- Photoemission Densities of Intrinsic Surface States for Si, Ge, and GaAsPhysical Review Letters, 1972
- Band Structure of Silicon from an Adjusted Heine-Abarenkov CalculationPhysical Review B, 1966