Minority carrier injection of metal-silicon contacts
- 31 March 1969
- journal article
- Published by Elsevier in Solid-State Electronics
- Vol. 12 (3), 155-160
- https://doi.org/10.1016/0038-1101(69)90027-6
Abstract
No abstract availableKeywords
This publication has 8 references indexed in Scilit:
- Surface Effects on Metal-Silicon ContactsJournal of Applied Physics, 1968
- Silicon Schottky Barrier Diode with Near-Ideal I-V CharacteristicsBell System Technical Journal, 1968
- Metal-semiconductor surface barriersSolid-State Electronics, 1966
- Characteristics of injecting point contacts on semiconductors—I In darknessSolid-State Electronics, 1966
- Minority carrier injection and charge storage in epitaxial Schottky barrier diodesSolid-State Electronics, 1965
- Metal to Semiconductor Contacts: Injection or Extraction for Either Direction of Current FlowPhysical Review B, 1959
- Rectification Properties of Metal-Silicon ContactsJournal of Applied Physics, 1957
- Rectification Properties of Metal Semiconductor ContactsJournal of Applied Physics, 1955